Reflection light-field microscope with a digitally tunable aperture by single-pixel imaging
OPTICS EXPRESS(2019)
Abstract
Reflected light microscope is a tool for imaging opaque specimens. However, most of the existing reflected light microscopes can only obtain the two-dimensional image of the specimen. Here we demonstrate that with the help of single-pixel imaging, we can develop a reflection light-field microscopy for volumetric imaging. Importantly, using single-pixel imaging, we can digitally adjust the size of the aperture diaphragm of the proposed reflection light-field microscope for changing the depth of field and for achieving three-dimensional differential phase-contrast imaging in an arbitrary direction, without a hardware change. Our approach may benefit various reflective specimens with wide depth information in the semiconductor industry and material science. (C) 2019 Optical Society of America under the terms of the OSA Open Access Publishing Agreement
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Key words
Single-Pixel Imaging,Refractive Index Measurement,Scanning Probe Microscopy
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