Single-Shot 2-D Burst Ultrafast Thz Imaging Utilizing Sf-Stamp

european quantum electronics conference(2019)

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摘要
Summary form only given. Since terahertz (THz) electromagnetic wave exhibits high transparency for various matters and can probe fingerprint spectra of various substances, THz imaging is expected for various quality inspections. Thus, it is desireble to capture 2-D images without spatial scanning. Moreover, if we can capture 2-D burst images of ultrafast transient phenomena in a single shot basis, it will be a powerful tool to understand the response of matters under high electric fields. However, with the conventional terahertz imaging method[1], iterative measurements are always required for capturing dynamic 2-D images. We had developed a single shot two-dimensional burst imaging method, SF -STAMP [2], in the visible to near infrared region. In the STAMP scheme, a high speed phenomenon is captured using a frequency chirped probe laser pulse where the instantaneous frequency exactly corresponds to the time. In this study, we modifyed the SF -STAMP for THz burst imaging by captureing EO sampling images with a chirped ultrafast laser pulse.
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关键词
EO sampling images,frequency chirped probe laser pulse,high speed phenomenon,visible to near infrared region,single shot two-dimensional burst imaging method,high electric fields,fingerprint spectra,electromagnetic wave,single-shot 2-D burst ultrafast terahertz imaging,conventional terahertz imaging method,ultrafast transient phenomena
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