Signal Rate Activity as a Formal Method for Fault Discovery and Monitoring in Trusted and Secure Electronics Development
Midwest Symposium on Circuits and Systems Conference Proceedings(2019)
摘要
Switching Rate Activity (SRA) is developed as a candidate formal security measure during hardware design phase of product development. SRA of fault models can help in detection of faults by comparing to designs without faults. SRA is often calculated using test vectors, which limits its applicability for verification of Trusted Electronics. We present an overview on SRA calculation methods using probability and Binary Decision Diagram methods, and an implementation of one method via a formal approach, without test vectors. The implementation is evaluated for use in Trusted Electronic metrics.
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关键词
Switching Rate Activity,Trusted Electronics,Formal Verification
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