Study of the Deposited Energy Spectra in Silicon by High Energy Neutron and Mixed Fields
IEEE Transactions on Nuclear Science(2020)
Abstract
The energy deposition spectra in a silicon detector have been measured at chip irradiation (ChipIr) and Cern High energy AcceleRator Mixed field (CHARM) facilities. The measurement was possible thanks to a fast electronic chain that can cope with high instantaneous fluxes. A computational study of the energy deposition in a silicon detector allows for the comparison of high-energy spallation facil...
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Key words
Neutrons,Silicon,Semiconductor device measurement,Detectors,Protons,Proton accelerators,Radiation effects
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