Scanning Electron Microscopy As a Flexible Technique for Investigating the Properties of UV-emitting Nitride Semiconductor Thin Films
C. Trager-Cowan,A. Alasmari, W. Avis,J. Bruckbauer,P. R. Edwards,B. Hourahine,S. Kraeusel,G. Kusch,R. Johnston,G. Naresh-Kumar,R. W. Martin,M. Nouf-Allehiani,E. Pascal,L. Spasevski,D. Thomson,S. Vespucci,P. J. Parbrook,M. D. Smith,J. Enslin,F. Mehnke,M. Kneissl,C. Kuhn,T. Wernicke,S. Hagedorn,A. Knauer,V. Kueller,S. Walde,M. Weyers,P. -M. Coulon,P. A. Shields,Y. Zhang,L. Jiu,Y. Gong,R. M. Smith,T. Wang,A. Winkelmann Photonics Research（2019）
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