Power Profiling of Modern Die-Stacked Memory

IEEE Computer Architecture Letters(2019)

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摘要
Die-stacked memories that integrate multiple DRAM dies into the processor package have reduced the interface bottleneck and improved efficiency, but demands for memory capacity and bandwidth remain unfulfilled. Additionally, the introduction of memory into the package further complicates heat removal. Memory power is therefore becoming a key architectural concern. To provide insight into these cha...
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关键词
Power system measurement,Integrated circuits,Three-dimensional displays,Random access memory,Memory management
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