Idef-X Hdbd:Low-Noise Asic For Spectro-Imaging With Semiconductor Detectors

2018 IEEE NUCLEAR SCIENCE SYMPOSIUM AND MEDICAL IMAGING CONFERENCE PROCEEDINGS (NSS/MIC)(2018)

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Abstract
IDeF-X HDBD is the new version of a family of integrated circuits dedicated to the readout of semiconductor detectors. It is a 32-channel Application Specific Integrated Circuit designed to read charges ranging from -40 to 40 fC. The circuit was optimized for small detector capacitances (<1pF) and low leakage current (<1nA). The chip allows to reach an Equivalent Noise Charge floor (ENC) of 17 el.rms. It has a self-triggering capability allowing multiple types of readout either only hit channels, selected channels or all channels. Each channel is based on a scaled charge sensitive amplifier follower by a CR-RC2 filter and a peak detector with a pile-up rejection system allowing memorizing only the first arriving charge. Each channel has a power consumption of 850 mu W. Gain and shaping time are tunable. This circuit has been designed with radiation mitigation techniques allowing it to handle a dose up to 300 krad and a Single Event Latchup (SEL) threshold of 65 MeV.cm(2)/mg suitable for space applications. This ASIC can read either Cadmium Telluride or Silicon detectors for instance for imaging-spectroscopy applications.
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Key words
ASIC, X-Ray, Imaging-Spectroscopy, ENC, Space Application
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