Improved Data Analysis with IVAS 4 and AP Suite

Journal Article Improved Data Analysis with IVAS 4 and AP Suite Get access DA Reinhard, DA Reinhard CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI 53711 USA Corresponding author: David.reinhard@ametek.com Search for other works by this author on: Oxford Academic Google Scholar TR Payne, TR Payne CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI 53711 USA Search for other works by this author on: Oxford Academic Google Scholar EM Strennen, EM Strennen CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI 53711 USA Search for other works by this author on: Oxford Academic Google Scholar E Oltman, E Oltman CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI 53711 USA Search for other works by this author on: Oxford Academic Google Scholar BP Geiser, BP Geiser CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI 53711 USA Search for other works by this author on: Oxford Academic Google Scholar GS Sobering, GS Sobering CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI 53711 USA Search for other works by this author on: Oxford Academic Google Scholar J Mandt J Mandt CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI 53711 USA Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 25, Issue S2, 1 August 2019, Pages 302–303, https://doi.org/10.1017/S1431927619002241 Published: 01 August 2019