News on Silicon Drift Detectors for High Resolution EDX Imaging and Spectroscopy

Adrian Niculae, Thiago Barros,Alois Bechteler, Robert Lackner,Kathrin Hermenau, Klaus Heizinger, Tristan Mönninghoff,Heike Soltau, Lothar Strüder

Microscopy and Microanalysis(2019)

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