STM/STS study on film thickness depending electronic states in α-Sn/InSb(001) Kota Hiwatari, Sigeru Kaku,Junji YoshinoThe Japan Society of Applied Physics（2019）引用 23|浏览15暂无评分关键词film thickness,electronic statesAI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
