Control of temperature distribution to suppress macro-defects in solution growth of 4H-SiC crystals

Journal of Crystal Growth(2019)

Cited 16|Views4
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Abstract
•Surface damage caused before seeding and roughening by SiC particles were investigated.•Hillocks of 6H-SiC were formed on the seed surface before seeding by vaporized solvent.•The melt-back process completely removed the damaged layer before growth began.•Adhesion of SiC particles on the growth surface introduced surface roughening.•Adhesion of SiC particles was suppressed by control of carbon supersaturation.
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Key words
A1. Roughening,A2. Growth from solutions,A2. Top seeded solution growth,B1. Silicon carbide
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