Investigating ice surfaces formed near the freezing point in the vapor phase via atomic force microscopy

An atomic force microscope (AFM) using a qPlus sensor was developed to observe ice surfaces grown near the freezing point in the vapor phase. The AFM system was equipped with multi-environmental control mechanisms for the temperature, humidity, and pressure of the introduced gas and the substrate temperature. Topographic images of the basal face of the ice, grown from a supersaturated water vapor, were obtained near equilibrium conditions via frequency modulation AFM (FM-AFM). Surface morphologies corresponding to steps and terraces were successfully observed. Force-curve measurements were also performed on the ice surfaces using FM-AFM. The results can be explained by the quasi-liquid layer on the ice surface. (C) 2019 The Japan Society of Applied Physics