Multilayer ion trap with three-dimensional microwave circuitry for scalable quantum logic applications

We present a multilayer surface-electrode ion trap with embedded 3D microwave circuitry for implementing entangling quantum logic gates. We discuss the electromagnetic full-wave simulation procedure that has led to the trap design and the characterization of the resulting microwave field pattern using a single ion as a local field probe. The results agree with simulations within the uncertainty; compared to previous traps, this design reduces detrimental AC Zeeman shifts by three orders of magnitude. The design presented here can be viewed as an entangling gate component in a library for surface-electrode ion traps intended for quantum logic operations.