Innovative Practices on Automotive Test

Wim Dobbelaere,Marco Restifo,Peter Sarson

2019 IEEE 37th VLSI Test Symposium (VTS)（2019）

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摘要

In this IP session, there will be 2 presentations focusing on how to increase the in-field quality level of A/MS devices. The 1 ^st presentation will discuss how to increase the observed return rates of Automotive ICs to 10ppb but at the same time as removing the costly burn in stage.

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关键词

in-field quality level,A/MS devices,st presentation,observed return rates,innovative practices,automotive IC,automotive test,system level test,automotive device reliability

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