Carrier Trap Parameters in NaI with Tl, In, and Eu DopantsS. Gridin,R. T. Williams,A. Belsky,E. Galenin,A. Gektin,N. Shiran,S. Vasiukov,A. Vasil'evJOURNAL OF PHYSICAL CHEMISTRY C（2019）引用 5|浏览6AI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
