Commissioning of a photoelectron spectrometer for soft X-ray photon diagnostics at the European XFEL
JOURNAL OF SYNCHROTRON RADIATION(2019)
Abstract
Commissioning and first operation of an angle-resolved photoelectron spectrometer for non-invasive shot-to-shot diagnostics at the European XFEL soft X-ray beamline are described. The objective with the instrument is to provide the users and operators with reliable pulse-resolved information regarding photon energy and polarization that opens up a variety of applications for novel experiments but also hardware optimization.
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Key words
photon diagnostics,photoelectron spectrometer,polarimeter,EuXFEL,FEL
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