Electroluminescence Yield in low-diffusion Xe-He gas mixtures

Fernandes A. F. M., Henriques C. A. O., Mano R. D. P., González-Díaz D.,Azevedo C. D. R.,Gómez-Cadenas J. J.,Freitas E. D. C.,Fernandes L. M. P.,Monteiro C. M. B., Adams C.,Álvarez V., Arazi L., Arnquist I. J.,Bailey K.,Ballester F., Benlloch-Rodríguez J. M.,Borges F. I. G. M., Byrnes N., Cárcel S., Carríon J. V., Cebrían S., Church E., Conde C. A. N.,Díaz J., López G. Díaz, Diesburg M.,Escada J., Esteve R., Felkai R., Ferrario P., Ferreira A. L., Generowicz J.,Ghosh S., Goldschmidt A., Guenette R., Gutiérrez R. M., Haefner J.,Hafidi K., Hauptman J.,Morata J. A. Hernando, Herrero P., Herrero V., Ifergan Y., Johnston S., Jones B. J. P., Kekic M., Labarga L., Laing A., Lebrun P., López-March N.,Losada M., Martín-Albo J.,Martínez A., Martínez-Lema G., McDonald A. D., Monrabal F., Mora F. J.,Vidal J. Muñoz, Novella P., Nygren D. R.,Palmeiro B., Para A., Pérez J.,Psihas F., Querol M., Repond,Renner J., Riordan S., Ripoll L., García Y. Rodríguez,Rodríguez J., Rogers L., Romeo B., Romo-Luque C., Santos F. P.,Santos J. M. F. dos,Simón A., Sofka C.,Sorel M., Stiegler T., Toledo J. F., Torrent J., Usón A., Veloso J. F. C. A., Webb R., Weiss-Babai R., White J. T., Woodruff K.,Yahlali N.

arxiv(2019)

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摘要
High pressure xenon Time Projection Chambers based on secondary scintillation, electroluminescence, signal amplification are being proposed for rare event detection such as directional dark matter, double electron capture and double beta decay detection. The discrimination of the rare event through the topological signature of primary ionization trails is a major asset for this type of TPCs when compared to single liquid or double-phase TPCs, limited by the high electron diffusion in pure xenon. Helium admixtures with xenon can be an attractive solution to reduce the electron diffusion significantly, improving the discrimination efficiency of these optical TPCs. We have measured the electroluminescence yield of XeHe mixtures, in the range of 0 to 30 percent He and demonstrated the small impact on the EL yield of the addition of He to pure Xe. For a typical reduced electric field of 2.5 kV / cm / bar in the scintillation region, the EL yield is reduced by 2 percent, 3 percent, 6 percent and 10 percent for 10 percent, 15 percent, 20 percent and 30 percent of He concentration, respectively, a reduction that is lower than what was expected from simulation results presented in the literature. The impact of the addition of He on EL statistical fluctuations is negligible, within the experimental uncertainties.
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