Full 300mm fin based QD device characterization
Hubert C. George,N. Thomas,R. Pillarisetty,Lester Lampert,Thomas Watson,J. M. Roberts,Stephanie A. Bojarski,Payam Amin, J. Torres,M. Metz,Guoji Zheng,Anne-Marije Zwerver,Jelmer Boter,Juan Pablo Dehollain,GertJan Eenink,Leonardo Massa,Diego Sabbagh,Nodar Samkharadze,Christian Volk,Brian Wütz,Menno Veldhorst,Giordano Scappucci,L. M. K. Vandersypen,Jim Clarke Bulletin of the American Physical Society(2019)
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qd device characterization
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