In situ micropillar compression of Al/SiC nanolaminates using laboratory-based nanoscale X-ray microscopy: Effect of nanopores on mechanical behavior

In situ studies using X-ray tomography have gained immense popularity in the recent past owing to their non-destructive nature and ability to capture the microstructure of a wide range of materials in 3D. In this work, we have conducted in situ micropillar compression and studied damage evolution in Al/SiC nanolaminates using a laboratory-based nanoscale X-ray microscope. Nanoscale defects present in the microstructure were characterized in 3D. The effect of these nanopores on damage initiation was quantified and is discussed. Additionally, the effect of Ga+ ion milling on micropillar fabrication was characterized by performing a comparative experiment on pillars fabricated using Ga+ and Ne+ ion source based focused ion beams.