Initial carrier-injection dynamics in organic thin-film transistor observed with time domain reflectometry in thickness direction

We propose time-domain reflectometry as an effective tool to investigate the dynamics of electronic devices. We use this technique to experimentally detect with 10 ns time resolution the dynamic process of carrier injection from the contact electrode into an organic thin film transistor as a time evolution of the device impedance. This method allows us to trace vertical carrier injection in the thickness direction. (C) 2019 The Japan Society of Applied Physics