Superior Performance of 5 nm Gate Length GaN Nanowire nFET for Digital Logic Applications
IEEE Electron Device Letters(2019)
摘要
We investigate the performance of 5-nm gate length GaN nMOS nanowire field effect transistor (GaN-NW-nFET) of various geometrical shapes, around the limits of cross-sectional scalability, using atomistic quantum transport simulations. For square cross-sections, the benchmarking results with the simulated Si-NW-nFET reveal over 30% enhancement in GaN drive current in both low standby power (LP −
$I_{ \mathrm{\scriptscriptstyle OFF}}=1$
nA/
$\mu \text{m}$
) and high performance (HP −
$I_{ \mathrm{\scriptscriptstyle OFF}}=100$
nA/
$\mu \text{m}$
) applications. Further performance enhancement is observed with the use of non-square geometries that are akin to GaN’s wurtzite crystal structure. Particularly, for
${T}_{\text {nw}}=2.4 $
mn, triangular cross-section GaN-NW-nFETs exhibit the smallest subthreshold swing, down to 62 mv/decade, excellent drive current,
${I}_{\text {DSAT}} > 2\times 10^{6}\,\, \mu \text {A}/ \mu \text {m}^{2}$
and superior energy-delay product compared to simulated Si-NW-nFET.
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关键词
Gallium nitride,Logic gates,Silicon,Shape,Ions,Effective mass,Performance evaluation
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