Quartz conditioning crystal for X-ray rocking curve topography

A large -quartz crystal designed to condition the monochromatic beam at beamline 1-BM of the Advanced Photon Source is presented. The purpose of this crystal was to provide a precise match to the Bragg angle of quartz crystals that are commonly used to make analyzers for plasma diagnostics. In order to characterize these analyzers, area detectors need to be positioned at distances from the analyzer at upwards of 1000mm. As a result of this precise matching, a Bragg-reflected beam from such an analyzer is precisely parallel to the beam incident on the conditioning crystal. This situation alleviates the need to adjust the position of the area detector as the distance between the analyzer and the area detector is varied. That is, there is no need to account for vertical displacement of the diffracted-beam image as a function of this distance. Additionally, verification that the analyzer is set to the correct Bragg reflection is obtained by scanning this distance, because only for a spurious reflection will there be a vertical displacement. This is a very useful check. To commission the conditioning crystal, diffraction from a high-quality flat quartz crystal was mapped using a CCD. Bragg diffraction from the reflection at 8.5keV was studied over an area of 23 x 31mm. The theoretical Darwin width of the flat sample in this case was 4.7 mu rad. An FWHM value near 6 mu rad was measured over almost the entire mapped area. These data demonstrate that the resolution function for this four-crystal arrangement is approximate to 4 mu rad. Data are also presented for a 0.1mm-thick -quartz wafer pressed into a concave form, having a nominal radius of 500mm and intended for use as an analyzer. Because analyzers are bent crystals, diffraction occurs in narrow bands. When a multiple exposure is made as a function of rocking angle a striped pattern is obtained, which is commonly referred to as a zebra-stripe pattern. A series of zebra stripes from the Bragg reflection of the bent wafer over its 25mm-diameter area were recorded on a CCD. The zebra-stripe pattern was analyzed to show a uniform bending to a radius of 497.0 +/- 0.3mm, in support of the nominal value. An r.m.s. slope error of 7 mu rad was also obtained from this analysis.