A Coherent Measurement Method For Checking The Surface Microrelief Depth In Holographic And Diffractive Optical Elements
COMPUTER OPTICS（2015）
Abstract
Security holograms have been widely used for document and product authenticity protection. The quality of security holograms and master-matrices significantly depends on the perfection of the diffraction grating. The authors introduce a method for checking the security hologram quality based on indirect measurements of diffraction grating parameters. Theoretical results concerned with the use of this method for microrelief quality control are discussed.
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Key words
holography, diffraction gratings, diffraction theory, holographic optical elements, diffractive optical elements
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