Total reflection X-ray fluorescence analysis of highly mineralized water samples using relative intensities and scattered radiation

An algorithm for total reflection X-ray fluorescence analysis of samples containing significant amounts of light elements with Z < 11, which are difficult to detect, is proposed based on the use of X-ray fluorescence intensity ratios. Such relative signals are much less influenced by the actual shape of a specimen and its mass, thus providing more accurate results of analysis. A Rayleigh-to-Compton scattering intensity ratio depends on the light elements total content, which thus can be evaluated. That a theoretical calibration equation describing a dependence of the Rayleigh scattering intensity on the sample's mass can be applied to the sample mass determination is demonstrated. A fundamental parameter analysis algorithm is designed that minimizes a need for external or internal standards. Its validity is proved by analysis of highly mineralized water samples.