Thin-film growth and structural characterization of a novel layered iridate Ba7Ir3O13+δ

SEMICONDUCTOR SCIENCE AND TECHNOLOGY(2019)

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Abstract
Iridates have attracted immense interest since their strong spin-orbit coupling (SOC) can lead to rich exotic phenomena such as a J(eff )= 1/2 Mott insulating state. Here we report a novel iridate discovered in our efforts which aimed to synthesize Ba2IrO4 thin films Through systematic transmission and scanning transmission electron microscopy studies, we have shown this new compound possesses a layered orthorhombic structure with the composition of Ba7Ir3O13+delta (BIO). This material is an insulator with an optical band gap of similar to 1.3 eV. Furthermore, we found that the thin films of this material can be grown on differently orientated perovskite substrates or MgO substrates. Although all these films maintain an identical crystallographic orientation, i.e. its c-axis perpendicular to the substrate surface, they form various domain structures dependent on the substrate. When (001)-oriented LaAlO3 and (111) oriented SrTiO3 perovskites are used as substrates, the domains show 12 fold and 6 fold symmetry respectively, and the domain orientations are highly coherent and the domain-walls are atomically sharp. However, the films on the (110) oriented MgO substrates feature much less coherent domain walls and thread dislocations occur at the domain boundaries. These findings not only reveal a new playground for the study of the novel SOC physics of iridates, but also provide a route to tailor the domain wall structure via epitaxial lattice mismatch in films.
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Key words
iridate,thin films,transmission electron microscopy
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