Fundamental Characterization Of Anti-Soiling Coatings For Pv Glass: Application Of Small-Angle X-Ray Scattering

2018 IEEE 7TH WORLD CONFERENCE ON PHOTOVOLTAIC ENERGY CONVERSION (WCPEC) (A JOINT CONFERENCE OF 45TH IEEE PVSC, 28TH PVSEC & 34TH EU PVSEC)(2018)

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摘要
When dust and other particulates accumulate on the surface of solar modules, the efficiency of these soiled modules is significantly reduced. Soiling is especially problematic in regions with little rain, where water resources for cleaning modules are scarce. To combat this issue, anti-soiling coatings, on the top-surface of solar modules, are beginning to enter the market. However, limited understanding of anti-soiling mechanisms and uncertainty in their durability has limited their deployment. Porous coatings are anticipated to discourage soiling because their rough surfaces reduce the strength and probability of dirt-to-coating bonds. However, the evolution of this morphology through soiling cycles is largely unknown. Here we present the use of small angle X-ray scattering (SAXS) to monitor the morphology of pristine and soiled, industry-sourced coatings. Initial soiling tests are performed using a standardized soil (AZ road dust) in the lab. This work demonstrates the effectiveness of SAXS in monitoring coating morphology despite the presence of soil surface layers. The capability of SAXS studies to be performed under various temperature, humidity, and soiling conditions sets it apart as a strong characterization tool for developing the understanding of functionality and degradation mechanisms of anti-soiling coatings for PV glass.
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关键词
anti-soiling, anti-reflection, coatings, materials forensics, PV glass, self-cleaning, small-angle X-ray scattering, soiling
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