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Failure Thresholds in CBRAM Due to Total Ionizing Dose and Displacement Damage Effects

IEEE Transactions on Nuclear Science(2019)

Cited 2|Views83
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Abstract
With the growing interest to explore Jupiter's moons, technologies with +10 Mrad(Si) tolerance are now needed, to survive the Jovian environment. Conductive-bridging random access memory (CBRAM) is a nonvolatile memory that has shown a high tolerance to total ionizing dose (TID). However, it is not well understood how CBRAM behaves in an energetic ion environment where displacement damage (DD) eff...
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Key words
Ions,Radiation effects,Performance evaluation,Programming,Resistance,Silicon,Testing
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