Design and Test Issues of a SOl CMOS Voltage Controlled Oscillators for Radiation Tolerant Frequency Synthesizers
East-West Design & Test Symposium（2018）
Key words
SOI CMOS processes,total ionizing dose damage,DCC-LC VCO testing,DCC-LC VCO design,heavy ions exposure,frequency synthesizers,differential cross-coupled inductance-capacitance VCOs,RF voltage controlled oscillators,radiation tolerant frequency synthesizers,SOl CMOS voltage controlled oscillators,space applications,radiation test,size 180.0 nm,size 350.0 nm,Si
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