Magnetic charge distribution and stray field landscape of asymmetric néel walls in a magnetically patterned exchange bias layer system

The 3D stray field landscape above an exchange bias layer system with engineered domain walls has been fully characterized by quantitative magnetic force microscopy (qMFM) measurements. This method is based on a complete quantification of the MFM tip's imaging properties and the subtraction of its contribution from the measured MFM data by deconvolution in Fourier space. The magnetically patterned Ir17Mn83/Co70Fe30-exchange-bias-multilayers have been designed to contain asymmetric head-to-head (hh)/tail-to-tail (tt) Neel walls between domains of different magnetic anisotropies for potential use in guided particle transport. In the current application, qMFM reveals the effective magnetic charge profile on the surface of the sample-with high spatial resolution and in an absolute quantitative manner. These data enable to calculate the magnetostatic potential and the full stray field landscape above the sample surface. It has been successfully tested against: (i) micromagnetic simulations of the magnetization structure of a comparable exchange-bias layer system, (ii) measurements of the magnetization profile across the domain boundary with x-ray photoemission electron microscopy, and (iii) direct stray field measurements obtained by scanning Hall probe microscopy at elevated scan heights. This approach results in a quantitative determination of the stray field landscape at close distances to the sample surface, which will be of importance for remote magnetic particle transport applications in lab-on-a-chip devices. Furthermore, the highly resolving and quantitative MFM approach reveals details of the domain transition across the artificially structured phase boundary, which have to be attributed to a continuous change in the materials parameters across this boundary, rather than an abrupt one.