市販MOSFET SEE認定における応答変動性【Powered by NICT】

J. George, D. A. Clymer,T.L. Turflinger, L. W. Mason, Stephen E. Stone,R. Koga, E. Beach, K. Huntington, Lauenstein J.-M.,Jeffrey L. Titus,M. Sivertz

IEEE Transactions on Nuclear Science（2017）

Cited 23|Views18

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