短チャネルSOI MOSFETにおけるバイアス温度不安定性挙動のゲート長依存性【Powered by NICT】Wu Wang-Ran, J Lu,Liu Chang,Wu Heng,Tang Xiaoyu,Sun Jia-Bao,Zhang Rui,Yu Wen-Jie,Wang Xi,Zhao YiMicroelectronics Reliability(2016)引用 23|浏览23暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要