Construction of a quartz spherical analyzer: application to high-resolution analysis of the Ni Kα emission spectrum

JOURNAL OF APPLIED CRYSTALLOGRAPHY(2016)

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Abstract
The construction and characterization of a focusing X-ray spherical analyzer based on alpha-quartz 4<(4)overbar>404 are presented. The performance of the analyzer was demonstrated by applying it to a high-resolution X-ray spectroscopy study of the K alpha(1,2) emission spectrum of Ni. An analytical representation based on physical grounds was assumed to model the shape of the X-ray emission lines. Satellite structures assigned to 3d spectator hole transitions were resolved and determined as well as their relative contribution to the emission spectrum. The present results on 1s(-1)3d(-1) shake probabilities support a recently proposed calculation framework based on a multi-configuration atomic model.
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Key words
spherical analyzers,X-ray emission spectroscopy,inelastic X-ray scattering,X-ray optics,quartz crystals
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