Atomic Force Microscopy Study of Monodisperse Carbon Nanoparticles

Semiconductors(2019)

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摘要
Monodisperse carbon nanodots and nanodiamond particles were studied by AFM method. Particle size distributions were calculated using AFM and DLS data. The results obtained correspond to TEM measurements. It was demonstrated that AFM allows detecting nanoparticles with sizes less than 2 nm. The average size of the particles for both samples was found to be ~4 nm. It was found that PSD for CND and DND was symmetric and asymmetric, correspondingly. Such difference can be understood in terms of different crystal structure perfection and the specific aspects of nanosized carbon preparation technology.
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关键词
nanoparticles,atomic force,carbon,microscopy
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