Design and Test with Proton Beam of a 1.2 Gb/s Semi-custom Serialiser Implemented in 180 nm CMOS with SEU Mitigation by TMR

Matteo Lupi,G. Aglieri Rinella, M. Bonora,H. Hillemanns, D. Kim,T. Kugathasan,A. Lattuca, G. Mazza,K. M. Sielewicz,W. Snoeys

2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)（2017）

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摘要

This contribution describes the design of a semi-custom serialiser in 180nm CMOS technology. The design is verified for SEU immunity and BER with 30MeV protons.

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