Proton Test Results for a Commercial Fanout Buffer, a Variable Gain Amplifier, and a ±40V Operational Amplifier

Randall Milanowski,Slaven Moro,Norm Hall,Raichelle Aniceto,Bert Vermeire, Neal Nicholson

2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)（2017）

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摘要

We provide proton radiation test results for three commercial analog integrated circuits that have no space-qualified equivalents. Results suggest the components are suitable for some space applications. Additional testing for Enhanced Low Dose Rate Sensitivity and Single Event Latchup is recommended.

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关键词

Analog Electronics,Commercial Off The Shelf,Proton Testing,Radiation Hardness Assurance

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