Fourier optics of image formation in aberration-corrected LEEM.

•We developed an extended and generalize Fourier optics formalism for modeling image formation of one or two-dimensional objects in aberration-corrected low energy electron microscopy.•Comparison of this mathematically rigorous approach to the contrast transfer approach developed earlier identifies the class of objects that must be treated with Fourier optics.•Implementation of a multi-core, multi-threading programming architecture for performing Fourier optics simulations partially mitigates the drawback of its slow computational speed.