Characterisation of on-chip wireless interconnects based on silicon nanoantennas via near-field scanning optical microscopy

IET Optoelectronics(2019)

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摘要
Recently, a novel Photonic-Integrated Circuit (PIC) paradigm based on the use of a new kind of ultra-directive, low-loss, highly efficient and broadband silicon nanoantenna has enabled the first demonstration of an on-chip wireless interconnect, with potential applications in reconfigurable networks and lab-on-a-chip systems. Despite the fact that the far-field properties of these nanoantennas have been widely studied, their near-field behaviour stays unexplored. Here, the authors study this feature through scanning near-field optical microscopy (SNOM). For this purpose, the authors design and characterise an on-chip two-port wireless link using a tailored SNOM. The conducted near-field measurements will be useful to improve the design of these integrated photonic devices with potential impact on a variety of applications, from biosensing to optical communications.
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关键词
near-field scanning optical microscopy,nanophotonics,silicon,integrated optics,elemental semiconductors,optical interconnections,optical testing,optical design techniques,metamaterial antennas
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