Toward Microwave S- and X-Parameter Approaches for the Characterization of Ferroelectrics for Applications in FeFETs and NCFETs
IEEE Transactions on Electron Devices（2019）
关键词
Ferroelectric field-effect transistors (FeFETs),ferroelectric,negative-capacitance field-effect transistors (NCFETs),negative capacitance,S-parameters,steep-slope devices,X-parameters
AI 理解论文
溯源树
样例
生成溯源树，研究论文发展脉络
Chat Paper
正在生成论文摘要