All-Electrical Control of a Hybrid Electron Spin/Valley Quantum Bit in SOI CMOS Technology

2018 IEEE SYMPOSIUM ON VLSI TECHNOLOGY(2019)

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摘要
We successfully demonstrated experimentally the electrical-field-mediated control of the spin of electrons confined in an SOI Quantum Dot (QD) device fabricated with a standard CMOS process flow. Furthermore, we show that the Back-Gate control in SOI devices enables switching a quantum bit (qubit) between an electrically-addressable, yet charge noise-sensitive configuration, and a protected configuration.
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关键词
SOI CMOS technology,electrical-field mediated control,standard CMOS process flow,SOI devices,all-electrical control,hybrid electron spin-valley quantum bit,back-gate control,SOI quantum dot device,SOI QD device,quantum bit switching,charge noise-sensitive configuration,protected configuration,Si
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