High-definition and high-sensitivity CMOS image sensor with all-pixel image plane phase-difference detection autofocus
JAPANESE JOURNAL OF APPLIED PHYSICS(2018)
摘要
In this paper, we describe an overview of autofocus (AF) technology for digital still cameras, video camcorders, and smartphones. Subsequently, we propose a CMOS image sensor (CIS) with all-pixel image plane phase-difference detection AF (PDAF) and describe a device structure and an optical design for fast and high-quality AF and low-noise imaging. To perform both PDAF and imaging function in all pixels, an individual pixel is composed of two horizontally displaced sub-photodiodes (PDs) and one microlens (ML). In particular, we describe PD and pixel isolation technology for high-definition, high-sensitivity, and low-noise PDAF-CIS with about front-side-illuminated (FSI) 6.4-pm-size pixel and back-sideilluminated (BSI) 1. X mu m-size pixels. (C) 2018 The Japan Society of Applied Physics
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