An interlaboratory comparison of X-ray computed tomography measurement for texture and dimensional characterisation of additively manufactured parts

Andrew Townsend,Radu Racasan,Richard Leach,Nicola Senin,Adam Thompson,Andrew Ramsey,David Bate,Peter Woolliams, Stephen Brown,Liam Blunt

Additive Manufacturing（2018）

Cited 67|Views20

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Abstract

•ISO 25178-2 surface texture from X-ray CT, interlaboratory comparison, is presented.•Less than 0.5% Sa areal roughness between metrology CT and focus variation values.•Artefact design allows separation of surface determination and scaling errors.

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Key words

ISO 25178,Metrology,Surface texture,Additive manufacturing,X-ray computed tomography

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