A novel measurement technique for demonstrating carbon nanotube FET operation at microwave frequencies

This paper reports a novel new measurement technique developed to measure microwave frequency performance of nanoscale devices. Typically, nanoscale devices are high impedance making them difficult to measure at RF. To circumvent this problem, we have developed a new technique in which we perform a two-tone test on a device operated in compression and observe the output at the difference frequency. We use this technique to verify the operation of a carbon nanotube based Field effect transistor (FET) at frequencies up to 23 GHz.