Rigorous Analysis of Cylindrical Klystron Cavities for Precision Metrology ApplicationsJean-Michel Le Floch,Yuwei Fan,Michel Aubourg,D. Cros,Jeremy Bourhill,E.N. Ivanov,Valérie Madrangeas,Michael E. TobararXiv (Cornell University)（2013）引用 22|浏览7AI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
