Total-Ionizing-Dose Response of Nb 2 O 5 -Based MIM Diodes for Neuromorphic Computing Applications

Rong Jiang,En Xia Zhang,Simeng E. Zhao,Daniel M. Fleetwood,Ronald D. Schrimpf,Robert A. Reed,Michael L. Alles,Joshua C. Shank,M. Brooks Tellekamp,W. A. Doolittle

IEEE Transactions on Nuclear Science（2018）

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摘要

Nb2O5-based metal-insulator-metal (MIM) diodes are ideal for neuromorphic computing applications because they exhibit desirable rectification, hysteresis, and capacitance characteristics without electroforming. We employ capacitance-frequency measurements to evaluate the total-ionizing-dose res- ponse of these devices to avoid measurement-induced disturbance of trap distributions caused by typical...

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关键词

Capacitance,Radiation effects,Voltage measurement,Capacitors,Hysteresis,Neuromorphics,Capacitance measurement

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