Performance of the SALVE-microscope: Atomic-resolution TEM Imaging at 20 kVMartin Linck,Peter Hartel,Stephan Uhlemann,Frank Kahl,Heiko Müller,Joachim Zach,Johannes Biskupek,Marcel Niestadt,Ute Kaiser,Max HaiderMicroscopy and Microanalysis(2016)引用 0|浏览20暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要