Benefits of Aberration-corrected STEM and EELS in the Study of Nanoscale Materials for Energy and Photonic ApplicationsFeihong Nan,S Hosseini Vajargah,David Rossouw,S Y Woo,M Bugnet,M C Chan,N Gauquelin, S Stambula,Guozhen Zhu,Gianluigi A BottonMicroscopy and Microanalysis(2012)引用 30|浏览12暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要