Assessing the Impact of Thermal Profiles on the Elimination of Light- and Elevated-Temperature-Induced Degradation

Light- and elevated-temperature-induced degradation (LeTID) in p-type multicrystalline silicon has a severe impact on the effective minority carrier lifetime of silicon and remains a crucial challenge for solar cell manufacturers. The precise cause of the degradation is yet to be confirmed; however, several approaches have been presented to reduce the extent of degradation. This paper presents ins...