Automatic Application of LabVIEW on Electron Beam Analysis System
2018 IEEE International Conference on Mechatronics and Automation (ICMA)(2018)
Abstract
Automation plays an important role in many instruments. In the past, the technology is not mastered by domestic manufacturers. So many large instruments in industry are imported from abroad and that leads to high costs. What's more, some instruments are complicated to operate and are not suitable for technicians. In this paper, a brand new LabVIEW-based system is established to measure the parameters of electron beams. It realizes the separation of hardware and software, so we can selectively purchase hardware and design software according to actual needs. To support the hardware system, LabViewVirtual Instrument Software Architecture (VISA) and Data Acquisition (DAQ) are applied to control the probe's sampling position and data acquisition. To validate the reliability of system, tests were done and satisfactory performance was manifested in test results.
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Key words
Serial Port Communication,Data Acquisition System,LabView
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