Composition dependent microstructure and optical properties of boron carbide (BxC) thin films deposited by radio frequency-plasma enhanced chemical vapour deposition technique
Materials Research Bulletin(2019)
Abstract
•BxC thin films deposited via PECVD shows high reflectivity ∼ 81% at soft X-ray wavelength.•Films with stoichiometric variation obtained at different substrate self-bias values.•Correlation between optical constants and film stoichiometry has been discussed.•Tunability of optical band gap was observed with changing carbon content.
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Key words
A. Carbides,A. Optical materials,B. Plasma deposition,C. X-ray diffraction
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