Development of highly reliable ferroelectric random access memory and its Internet of Things applications
JAPANESE JOURNAL OF APPLIED PHYSICS(2018)
Abstract
Ferroelectric random access memory (FRAM) has been commercialized for about 20 years and its reliability has been well proven all over the world. In the recent Internet of Things (IoT) era, it also plays important roles to particularly in edge computing because of its high writing speed, high rewriting endurance, and low writing energy consumption. We review the history of semiconductor memories using ferroelectrics and overview the progresses of the new ferroelectrics and promising ferroelectric applications in the future. (C) 2018 The Japan Society of Applied Physics
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Key words
Memory Applications,Ferroelectricity,Thin Film Ferroelectrics
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